MATLS 730 / XRD2 and XRD# Diffraction Methods for Materials

1.5 unit(s)

J. Britten

Prerequisite(s): Must be enrolled in any Graduate Plan and have successfully completed MATLS 734

This course is a study of 2D and 3D X-ray diffraction for the characterization of crystalline solid materials. We will examine the diffraction information obtained in phase, texture and residual stress analyses of metals, coatings, thin films, polymers, etc. using area detector techniques. We will look at safety, sample preparation, data processing software and interpretation of results. The students will study their own research samples and present their analyses to the class.