MATLS 724 / Materials Characterization by Electron/Ion Microscopy

3 unit(s)

Cross-listed as MECH ENG 726

An introduction to the theory, physics and operating principles of Scanning electron microscopy (SEM), Focused Ion Beam (FIB) microscopy and attendant diffraction and spectroscopy techniques. The course will have laboratory component allowing students to students to establish core competence in hands-on use of these microscopes.