MATLS 4H03 - X-ray Analysis and Functional Properties of Polycrystalline and Thin Film Materials

3 unit(s)

X-ray analysis of bulk polycrystalline materials and thin films. Deposition and fabrication techniques, surfaces, growth mechanisms, epitaxy, kinetic effects in thin films, structure-property relationships and defects of thin films. Materials for packaging.
Two lectures; one tutorial (three hours); one term
Prerequisite(s): Registration in Level III or above of any Materials Engineering; or permission of the department
Offered on an irregular rotation basis.